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✎ device:ssd:start
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doku@ainoniwa
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====== SSD ====== * THNSNC064GBSJ * S.M.A.R.T * <code>root@yuyuko:~# ./hdd_temp.sh smartctl 5.42 2011-10-20 r3458 [i386-pc-solaris2.11] (local build) Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net === START OF INFORMATION SECTION === Device Model: TOSHIBA THNSNC064GBSJ Serial Number: X05S108DTCJZ Firmware Version: CJTA0202 User Capacity: 64,023,257,088 bytes [64.0 GB] Sector Size: 512 bytes logical/physical Device is: Not in smartctl database [for details use: -P showall] ATA Version is: 8 ATA Standard is: Exact ATA specification draft version not indicated Local Time is: Tue Dec 20 23:15:43 2011 JST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 120) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 7) minutes. SCT capabilities: (0x0039) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000a 100 100 000 Old_age Always - 0 2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0 3 Spin_Up_Time 0x0007 100 100 050 Pre-fail Always - 0 5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0 7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0 8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0 9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 72 10 Spin_Retry_Count 0x0013 100 100 050 Pre-fail Always - 0 12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 2 167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0 168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0 169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 481070416328 170 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 231944749138 173 Unknown_Attribute 0x0013 200 200 100 Pre-fail Always - 0 175 Program_Fail_Count_Chip 0x0013 100 100 010 Pre-fail Always - 0 192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 0 194 Temperature_Celsius 0x0023 076 073 030 Pre-fail Always - 24 (Min/Max 20/27) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 240 Head_Flying_Hours 0x0013 100 100 050 Pre-fail Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.</code>
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